skip to main content

Title: Simulation of the UT inspection of planar defects using a generic GTD-Kirchhoff approach

The modeling of ultrasonic Non Destructive Evaluation often plays an important part in the assessment of detection capabilities or as a help to interpret experiments. The ultrasonic modeling tool of the CIVA platform uses semi-analytical approximations for fast computations. Kirchhoff and GTD are two classical approximations for the modeling of echoes from plane-like defects such as cracks, and they aim at taking into account two different types of physical phenomena. The Kirchhoff approximation is mainly suitable to predict specular reflections from the flaw surface, whereas GTD is dedicated to the modeling of edge diffraction. As a consequence, these two approximations have distinct and complementary validity domains. Choosing between them requires expertise and is problematic in some inspection configurations. The Physical Theory of Diffraction (PTD) was developed based on both Kirchhoff and GTD in order to combine their advantages and overcome their limitations. The theoretical basis for PTD and its integration in the CIVA modeling approach are discussed in this communication. Several results that validate this newly developed model and illustrate its advantages are presented.
Authors:
; ;  [1] ;  [2]
  1. CEA, LIST, F-91191 Gif-sur-Yvette (France)
  2. Sound Mathematics Ltd., Cambridge, CB4 2AS (United Kingdom)
Publication Date:
OSTI Identifier:
22391231
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1650; Journal Issue: 1; Conference: 41. Annual Review of Progress in Quantitative Nondestructive Evaluation, Boise, ID (United States), 20-25 Jul 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; APPROXIMATIONS; COMPUTERIZED SIMULATION; CRACKS; CRYSTAL DEFECTS; DETECTION; DIFFRACTION; EVALUATION; INSPECTION; NONDESTRUCTIVE TESTING; REFLECTION; SURFACES; ULTRASONIC WAVES