Ternary systems based on PVDF, BaTiO{sub 3} and MWCNTs: Fabrication, characterization, electromagnetic simulation
- University of Rome “Niccolò Cusano”, RU INSTM, Via Don Carlo Gnocchi 3, 00166-Rome (Italy)
- University of Rome “Tor Vergata”, Enterprise Engineering Department, RU INSTM-Roma “Tor Vergata”, Via del Politecnico 1, 00133-Rome (Italy)
In this work, ternary bulk systems based on polyvinylidene fluoride (PVDF), synthesised barium titanate (BaTiO{sub 3}, BT) nanopowder and multi walled carbon nanotubes (MWCNTs) were fabricated by film stacking technique, starting from solvent cast films. The main purpose was to investigate the influence of BT and MWCNTs addition to the polymeric matrix on its microstructural and dielectrical properties. In order to achieve it, different BT concentrations, ranging between the 60 and 75 %wt, were tested, whereas a MWCNTs content of 2 %wt was maintained constant. The morphology was studied by observation at scanning electron microscopy (SEM), the microstructure and crystalline phases investigated by X-Ray diffraction (XRD) and Fourier transform infrared (FT-IR) spectroscopy, and the electromagnetic properties measured in the microwave region (8-12 GHz). The electromagnetic response of the investigated bulk systems was also simulated as function of the sample thickness.
- OSTI ID:
- 22391126
- Journal Information:
- AIP Conference Proceedings, Vol. 1648, Issue 1; Conference: ICNAAM-2014: International Conference on Numerical Analysis and Applied Mathematics 2014, Rhodes (Greece), 22-28 Sep 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
- Country of Publication:
- United States
- Language:
- English
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Related Subjects
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CARBON NANOTUBES
CONCENTRATION RATIO
FILMS
FOURIER TRANSFORMATION
GHZ RANGE
INFRARED SPECTRA
MATRIX MATERIALS
MICROSTRUCTURE
MICROWAVE RADIATION
MORPHOLOGY
ORGANIC FLUORINE COMPOUNDS
POLYVINYLS
POWDERS
SCANNING ELECTRON MICROSCOPY
SYNTHESIS
TITANATES
X-RAY DIFFRACTION