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Title: Electron beam simulation from gun to collector: Towards a complete solution

An electron-beam simulation technique for high-resolution complete EBIS/T modelling is presented. The technique was benchmarked on the high compression HEC{sup 2} test-stand with an electron beam current, current density and energy of 10 A, 10 kA/cm{sup 2} and 49.2 keV, and on the immersed electron beam at REXEBIS for electron beam characteristics of 0.4 A, 200 A/cm{sup 2} and 4.5 keV. In both Brillouin-like and immersed beams the electron-beam radius varies from several millimeters at the gun, through some hundreds of micrometers in the ionization region to a few centimeters at the collector over a total length of several meters. We report on our approach for finding optimal meshing parameters, based on the local beam properties such as magnetic field-strength, electron energy and beam radius. This approach combined with dividing the problem domain into sub-domains, and subsequent splicing of the local solutions allowed us to simulate the beam propagation in EBISes from the gun to the collector using a conventional PC in about 24–36 h. Brillouin-like electron beams propagated through the complete EBIS were used to analyze the beam behavior within the collector region. We checked whether elastically reflected paraxial electrons from a Brillouin-like beam will escape from the collectormore » region and add to the loss current. We have also studied the power deposition profiles as function of applied potentials using two electrode geometries for a Brillouin-like beam including the effects of backscattered electrons.« less
Authors:
; ;  [1] ; ;  [2]
  1. CERN, Geneva 23, CH-1211 (Switzerland)
  2. Brookhaven National Lab, Upton, NY 11973 (United States)
Publication Date:
OSTI Identifier:
22390850
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1640; Journal Issue: 1; Conference: 12. International Symposium on Electron Beam Ion Sources and Traps, East Lansing, MI (United States), 18-21 May 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; BACKSCATTERING; BENCHMARKS; COMPRESSION; CURRENT DENSITY; ELECTRODES; ELECTRON BEAM ION SOURCES; ELECTRON BEAMS; ELECTRON GUNS; ELECTRONS; KEV RANGE; LENGTH; MAGNETIC FIELDS; MATHEMATICAL SOLUTIONS; POTENTIALS; RESOLUTION; SPLICING