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Title: Diagnostic measurements of CUEBIT based on the dielectronic resonance process

In this paper we report the first observation of x-ray radiation from the new Clemson University Electron Beam Ion Trap (CUEBIT). The analysis of the emitted dielectronic recombination x-ray photons from highly charged argon ions allowed us to probe parameters specific to the ion cloud inside the machine. Argon dielectronic resonances could provide a standard method to cross-compare the electron beam and ion cloud characteristics of different devices.
Authors:
; ; ; ; ; ;  [1]
  1. Department of Physics and Astronomy, Clemson University, Clemson, SC 29634 (United States)
Publication Date:
OSTI Identifier:
22390847
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1640; Journal Issue: 1; Conference: 12. International Symposium on Electron Beam Ion Sources and Traps, East Lansing, MI (United States), 18-21 May 2014; Other Information: (c) 2015 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; 74 ATOMIC AND MOLECULAR PHYSICS; ARGON IONS; COMPARATIVE EVALUATIONS; EDUCATIONAL FACILITIES; ELECTRON BEAMS; MULTICHARGED IONS; PHOTON EMISSION; PHOTONS; RECOMBINATION; RESONANCE; TRAPS; X RADIATION