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Title: Poly-Gaussian model of randomly rough surface in rarefied gas flow

Journal Article · · AIP Conference Proceedings
DOI:https://doi.org/10.1063/1.4902619· OSTI ID:22390565
 [1];  [2]
  1. St.-Petersburg State University, Department of Mathematics and Mechanics, 198504, Universitetskiy pr., 28, Peterhof, St.-Petersburg (Russian Federation)
  2. St.-Petersburg State Polytechnic University, Department of Mathematics and Mechanics, 195251, Polytechnicheskaya ul., 29, St.-Petersburg (Russian Federation)

Surface roughness is simulated by the model of non-Gaussian random process. Our results for the scattering of rarefied gas atoms from a rough surface using modified approach to the DSMC calculation of rarefied gas flow near a rough surface are developed and generalized applying the poly-Gaussian model representing probability density as the mixture of Gaussian densities. The transformation of the scattering function due to the roughness is characterized by the roughness operator. Simulating rough surface of the walls by the poly-Gaussian random field expressed as integrated Wiener process, we derive a representation of the roughness operator that can be applied in numerical DSMC methods as well as in analytical investigations.

OSTI ID:
22390565
Journal Information:
AIP Conference Proceedings, Vol. 1628, Issue 1; Conference: 29. International Symposium on Rarefied Gas Dynamics, Xi'an (China), 13-18 Jul 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0094-243X
Country of Publication:
United States
Language:
English