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Title: Influence of secondary phases on phase and microwave dielectric properties of new Ca{sub 2}Ce{sub 2}Ti{sub 5}O{sub 16} ceramics

Ca{sub 2}Ce{sub 2}Ti{sub 5}O{sub 16} ceramics processed via mix oxide route was investigated. Phase composition and microwave dielectric properties were measured using X-ray diffraction and a cavity method, respectively. CeO{sub 2} and another unidentified phase (that vanishes at ≥1400°C) existed as secondary phases along with the parent Ca{sub 2}Ce{sub 2}Ti{sub 5}O{sub 16} phase. The amount of the parent Ca{sub 2}Ce{sub 2}Ti{sub 5}O{sub 16} phase increased with increasing sintering temperature from 1350°C to 1450 °C accompanied by a decrease in the apparent density. The density decreased but ε{sub r} and Qufo increased with sintering temperature. An ε{sub r} ∼87.2, Qufo ∼5915 GHz and τ{sub f} ∼219 GHz was achieved for the sample sintered at 1450°C.
Authors:
;  [1] ;  [2]
  1. Department of Physics, University of Science and Technology Bannu, 28100 KPK (Pakistan)
  2. Departments of Materials Science and Engineering, Institute of Space Technology, Islamabad 44000 (Pakistan)
Publication Date:
OSTI Identifier:
22390536
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1627; Journal Issue: 1; Conference: 14. Electroceramics Conference, Bucharest (Romania), 16-20 Jun 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CALCIUM COMPOUNDS; CERAMICS; CERIUM OXIDES; GHZ RANGE; MICROWAVE RADIATION; PERMITTIVITY; PHASE STABILITY; PHASE STUDIES; SINTERING; TEMPERATURE DEPENDENCE; TITANATES; X-RAY DIFFRACTION