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Title: Structural characterization of impurified zinc oxide thin films

Europium doped zinc oxide (Eu:ZnO) thin films have been obtained by pulsed laser deposition (PLD). 002 textured thin films were achieved on glass and silicon substrates, while hetero-epilayers and homo-epilayers have been attained on single crystal SrTiO{sub 3} and ZnO, respectively. X-ray Diffraction (XRD) was employed to characterize the Eu:ZnO thin films. Extended XRD studies confirmed the different thin film structural properties as function of chosen substrates.
Authors:
 [1] ; ; ; ;  [2]
  1. University of Bucharest, Faculty of Physics, 405 Atomistilor, 077125, Magurele, Ilfov, Romania and National Institute of Materials Physics, 105 bis Atomistilor, 077125 Magurele, Ilfov (Romania)
  2. National Institute of Materials Physics, 105 bis Atomistilor, 077125 Magurele, Ilfov (Romania)
Publication Date:
OSTI Identifier:
22390530
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1627; Journal Issue: 1; Conference: 14. Electroceramics Conference, Bucharest (Romania), 16-20 Jun 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DOPED MATERIALS; ENERGY BEAM DEPOSITION; EUROPIUM; LASER RADIATION; MONOCRYSTALS; PULSED IRRADIATION; SILICON; STRONTIUM TITANATES; SUBSTRATES; TEXTURE; THIN FILMS; X-RAY DIFFRACTION; ZINC OXIDES