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Title: Positron annihilation spectroscopy of vacancy-type defects hierarchy in submicrocrystalline nickel during annealing

Positron annihilation and X-ray diffraction analysis have been used to study submicrocrystalline nickel samples prepared by equal channel angular pressing. In the as-prepared samples the positrons are trapped at dislocation-type defects and in vacancy clusters that can include up to 5 vacancies. The study has revealed that the main positron trap centers at the annealing temperature of ΔT= 20°C-180°C are low-angle boundaries enriched by impurities. At ΔT = 180°C-360°C, the trap centers are low-angle boundaries providing the grain growth due to recrystallization in-situ.
Authors:
 [1] ; ; ;  [2] ; ; ; ;  [3] ;  [4]
  1. Institute of Strength Physics and Materials Science SB RAS, Tomsk, 634055, Russia and National Research Tomsk Polytechnic University, Tomsk, 634050 (Russian Federation)
  2. Institute of Strength Physics and Materials Science SB RAS, Tomsk, 634055 (Russian Federation)
  3. National Research Tomsk Polytechnic University, Tomsk, 634050 (Russian Federation)
  4. Institute for Metals Superplasticity Problems RAS, Ufa, 450001 (Russian Federation)
Publication Date:
OSTI Identifier:
22390418
Resource Type:
Journal Article
Resource Relation:
Journal Name: AIP Conference Proceedings; Journal Volume: 1623; Journal Issue: 1; Conference: International Conference on Physical Mesomechanics of Multilevel Systems 2014, Tomsk (Russian Federation), 3-5 Sep 2014; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ANNEALING; ANNIHILATION; DISLOCATIONS; GRAIN GROWTH; NICKEL; POSITRONS; PRESSING; RECRYSTALLIZATION; SPECTROSCOPY; TRAPPING; TRAPS; VACANCIES; X-RAY DIFFRACTION