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Title: A revised partiality model and post-refinement algorithm for X-ray free-electron laser data

Journal Article · · Acta Crystallographica. Section D: Biological Crystallography
 [1]; ;  [2]; ;  [3];  [1];  [2];  [1]
  1. Wellcome Trust Centre for Human Genetics, Roosevelt Drive, Oxford OX3 7BN (United Kingdom)
  2. Lawrence Berkeley National Laboratory, 1 Cyclotron Road, Berkeley, CA 94720 (United States)
  3. Harwell Science and Innovation Campus, Fermi Avenue, Didcot OX11 0QX (United Kingdom)

An updated partiality model and post-refinement algorithm for XFEL snapshot diffraction data is presented and confirmed by observing anomalous density for S atoms at an X-ray wavelength of 1.3 Å. Research towards using X-ray free-electron laser (XFEL) data to solve structures using experimental phasing methods such as sulfur single-wavelength anomalous dispersion (SAD) has been hampered by shortcomings in the diffraction models for X-ray diffraction from FELs. Owing to errors in the orientation matrix and overly simple partiality models, researchers have required large numbers of images to converge to reliable estimates for the structure-factor amplitudes, which may not be feasible for all biological systems. Here, data for cytoplasmic polyhedrosis virus type 17 (CPV17) collected at 1.3 Å wavelength at the Linac Coherent Light Source (LCLS) are revisited. A previously published definition of a partiality model for reflections illuminated by self-amplified spontaneous emission (SASE) pulses is built upon, which defines a fraction between 0 and 1 based on the intersection of a reflection with a spread of Ewald spheres modelled by a super-Gaussian wavelength distribution in the X-ray beam. A method of post-refinement to refine the parameters of this model is suggested. This has generated a merged data set with an overall discrepancy (by calculating the R{sub split} value) of 3.15% to 1.46 Å resolution from a 7225-image data set. The atomic numbers of C, N and O atoms in the structure are distinguishable in the electron-density map. There are 13 S atoms within the 237 residues of CPV17, excluding the initial disordered methionine. These only possess 0.42 anomalous scattering electrons each at 1.3 Å wavelength, but the 12 that have single predominant positions are easily detectable in the anomalous difference Fourier map. It is hoped that these improvements will lead towards XFEL experimental phase determination and structure determination by sulfur SAD and will generally increase the utility of the method for difficult cases.

OSTI ID:
22389069
Journal Information:
Acta Crystallographica. Section D: Biological Crystallography, Vol. 71, Issue Pt 6; Other Information: PMCID: PMC4461207; PMID: 26057680; PUBLISHER-ID: dz5368; OAI: oai:pubmedcentral.nih.gov:4461207; Copyright (c) Ginn et al. 2015; This is an open-access article distributed under the terms of the Creative Commons Attribution Licence, which permits unrestricted use, distribution, and reproduction in any medium, provided the original authors and source are cited.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0907-4449
Country of Publication:
Denmark
Language:
English

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Resolving indexing ambiguities in X-ray free-electron laser diffraction patterns journal February 2019
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Climbing the Data Mountain: Processing of SFX Data text January 2018
Processing serial crystallography data with CrystFEL : a step-by-step guide text January 2019
Processing serial crystallography data with CrystFEL : a step-by-step guide text January 2019

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