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Title: Localized surface plasmon assisted contrast microscopy for ultrathin transparent specimens

We demonstrate a high contrast imaging technique, termed localized surface plasmon assisted contrast microscopy, by combining localized surface plasmon resonances (LSPR) and dark-field microscopy technique. Due to the sensitive response of LSPR to the refractive index of the surrounding media, this technique is capable of converting a small refractive index difference to a change in scattering intensity, resulting in a high-contrast, diffraction limited image of a thin unstained specimen with small, gradual refractive-index variation.
Authors:
; ;  [1] ; ;  [2] ;  [1] ;  [3] ;  [3]
  1. Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093-0407 (United States)
  2. Department of Physics, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)
  3. (United States)
Publication Date:
OSTI Identifier:
22350975
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DIFFRACTION; MICROSCOPY; PLASMONS; REFRACTIVE INDEX; RESONANCE; SURFACES