Localized surface plasmon assisted contrast microscopy for ultrathin transparent specimens

Journal Article · Mon Oct 20 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4898675· OSTI ID:22350975

Wei, Feifei; Lu, Dylan; Aguinaldo, Ryan ^[1]; Ma, Yicong; Sinha, Sunil K. ^[2]; Liu, Zhaowei ^[1]

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1. Department of Electrical and Computer Engineering, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093-0407 (United States)
2. Department of Physics, University of California, San Diego, 9500 Gilman Drive, La Jolla, California 92093 (United States)

We demonstrate a high contrast imaging technique, termed localized surface plasmon assisted contrast microscopy, by combining localized surface plasmon resonances (LSPR) and dark-field microscopy technique. Due to the sensitive response of LSPR to the refractive index of the surrounding media, this technique is capable of converting a small refractive index difference to a change in scattering intensity, resulting in a high-contrast, diffraction limited image of a thin unstained specimen with small, gradual refractive-index variation.

• OSTI ID: 22350975
• Journal Information: Applied Physics Letters, Vol. 105, Issue 16; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
DIFFRACTION
MICROSCOPY
PLASMONS
REFRACTIVE INDEX
RESONANCE
SURFACES