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Title: Electron-hole recombination on ZnO(0001) single-crystal surface studied by time-resolved soft X-ray photoelectron spectroscopy

Time-resolved soft X-ray photoelectron spectroscopy (PES) experiments were performed with time scales from picoseconds to nanoseconds to trace relaxation of surface photovoltage on the ZnO(0001) single crystal surface in real time. The band diagram of the surface has been obtained numerically using PES data, showing a depletion layer which extends to 1 μm. Temporal evolution of the photovoltage effect is well explained by a recombination process of a thermionic model, giving the photoexcited carrier lifetime of about 1 ps at the surface under the flat band condition. This lifetime agrees with a temporal range reported by the previous time-resolved optical experiments.
Authors:
; ; ; ; ; ;  [1] ;  [2] ; ;  [3] ; ;  [4]
  1. Institute for Solid State Physics, The University of Tokyo, Kashiwa, Chiba 277-8581 (Japan)
  2. Department of Chemistry and Materials Science, Tokyo Institute of Technology, Meguro-ku, Tokyo 152-8551 (Japan)
  3. Department of Physics, Sophia University, Chiyoda-ku, Tokyo 102-8554 (Japan)
  4. Nara Institute of Science and Technology (NAIST), Ikoma, Nara 630-0192 (Japan)
Publication Date:
OSTI Identifier:
22350884
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 15; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CARRIER LIFETIME; DEPLETION LAYER; ELECTRONIC STRUCTURE; HOLES; MONOCRYSTALS; PHOTOELECTRON SPECTROSCOPY; RECOMBINATION; RELAXATION; SOFT X RADIATION; SURFACES; TIME RESOLUTION; ZINC OXIDES