Hard x-ray nanofocusing by refractive lenses of constant thickness

Journal Article · Mon Sep 29 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4896914· OSTI ID:22350780

Scholz, M.; Patommel, J.; Hoppe, R.; Wittwer, F. ^[1]; Reinhardt, J. ^[1]; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg ^[2]; Seidel, J. ^[3]; Knaut, M.; Jahn, A.; Richter, K.; Bartha, J. W. ^[4]; Falkenberg, G. ^[5]; Schroer, C. G. ^[1]; Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg ^[2]

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1. Institute of Structural Physics, Technische Universität Dresden, D-01062 Dresden (Germany)
2. Germany
3. Faculty of Mathematics, Technische Universität Chemnitz, D-09107 Chemnitz (Germany)
4. Institute of Semiconductors and Microsystems, Technische Universität Dresden, D-01062 Dresden (Germany)
5. Deutsches Elektronen-Synchrotron DESY, D-22607 Hamburg (Germany)

In order to focus light or x rays, the thickness of a refractive lens is typically varied over its aperture. Here, we present a refractive x-ray lens made of lamellae of constant thickness, the refractive lamellar lens. Refractive power is created by a specific bending of the lamellae rather than by a concave lens profile. This very special design has the technological advantage that materials like sapphire or diamond can be used to make lenses by coating techniques. A first lens prototype focused x rays with a photon energy E = 15.25 keV to a lateral beam size of 164 nm × 296 nm full width at half maximum.

• OSTI ID: 22350780
• Journal Information: Applied Physics Letters, Vol. 105, Issue 13; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
APERTURES
BEAMS
BENDING
CRYSTALLINE LENS
DIAMONDS
HARD X RADIATION
KEV RANGE
MATERIALS
REFRACTION
SAPPHIRE
THICKNESS
VISIBLE RADIATION