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Title: Imaging and characterization of piezoelectric potential in a single bent ZnO microwire

We achieved direct visualization of the piezoelectric potentials in a single bent ZnO microwire (MW) using focused synchrotron radiation (soft x-ray) scanning photoelectron spectro-microscopy. Using radial-line scan across the bent section of ZnO MW, the characteristic core-level shifts were directly related to the spatial distribution of piezoelectric potentials perpendicular to the ZnO polar direction. Using piezoelectric modeling in ZnO, we delineated the band structure distortion and carrier concentration change from tensile to compressed sides by combining the spatial resolved cathodoluminescence characteristics in an individual microwire. This spectro-microscopic technique allows imaging and identification of the electric-mechanical couplings in piezoelectric micro-/nano-wire systems.
Authors:
; ; ;  [1] ;  [2] ; ; ;  [3] ; ;  [4]
  1. Department of Physics, National Cheng Kung University, Tainan 70101, Taiwan (China)
  2. Center for Micro/Nano Science and Technology, National Cheng Kung University, Tainan 70101, Taiwan (China)
  3. National Synchrotron Radiation Research Center, Hsinchu 30076, Taiwan (China)
  4. Department of Photonics, National Cheng Kung University, Tainan 70101, Taiwan (China)
Publication Date:
OSTI Identifier:
22350764
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 12; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CARRIERS; CATHODOLUMINESCENCE; COUPLINGS; MICROSTRUCTURE; PIEZOELECTRICITY; SIMULATION; SOFT X RADIATION; SPATIAL DISTRIBUTION; SYNCHROTRON RADIATION; WIRES; ZINC OXIDES