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Title: A facile approach to prepare graphene via solvothermal reduction of graphite oxide

Highlights: • Graphene was prepared via a novel and facile solvothermal reduction method for graphite oxide. • Most of the oxygen functional groups of graphite oxide were removed. • The reduced graphene oxide obtained was featured with bilayer nanosheets. - Abstract: In this work, a facile reduction strategy is reported for the fabrication of graphene. Graphite oxide (GO) is reduced via a novel solvothermal reaction in a mixed solution of acetone and sodium hypochlorite (NaClO). The structure, surface chemistry, morphology and thermal stability of the as-prepared reduced graphene oxide (RGO) are characterized by X-ray diffraction (XRD), Fourier transform infrared spectroscopy (FTIR), Raman spectroscopy, transmission electron microscopy (TEM), atomic force microscopy (AFM), thermogravimetric analysis (TGA) and X-ray photoelectron spectroscopy (XPS). The results indicate that most of the oxygenated groups in GO are effectively removed in this solvothermal reaction. The novel reduction method provides a simple, cost-effective and efficient strategy for the fabrication of graphene.
Authors:
 [1] ;  [2] ;  [1] ; ;  [1] ;  [2] ; ;  [1] ;  [1] ;  [2]
  1. State Key Laboratory of Fire Science, University of Science and Technology of China, Hefei 230026 (China)
  2. (China)
Publication Date:
OSTI Identifier:
22348669
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 55; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 77 NANOSCIENCE AND NANOTECHNOLOGY; ATOMIC FORCE MICROSCOPY; FABRICATION; FOURIER TRANSFORM SPECTROMETERS; FOURIER TRANSFORMATION; GRAPHENE; GRAPHITE; INFRARED SPECTRA; NANOSTRUCTURES; OXIDES; OXYGEN; RAMAN SPECTROSCOPY; SYNTHESIS; THERMAL GRAVIMETRIC ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY