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Title: Lu{sub 2}O{sub 3}:Eu{sup 3+} glass ceramic films: Synthesis, structural and spectroscopic studies

Graphical abstract: - Highlights: • Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} films were synthesized by sol–gel and by dip-coating technique. • Effects of incorporating PVP on structural properties were studied. • Effects of incorporating silica (SiO{sub 2}) luminescence characteristics were analyzed. • X-ray diffraction results showed that Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} crystallizes at 700 °C. • The 611 nm emission for the Lu:Si = 8:1 system presented an improvement. - Abstract: For the first time, transparent and crack free europium-doped lutetia silica sol–gel films were synthesized using the dip-coating technique on silica quartz substrates. In this study, we examined the effects of incorporating polyvinylpyrrolidone (PVP) and silica (SiO{sub 2}) into different precursor solutions for different Lu–Si molar ratios: 4:1, 6:1, 8:1 and 10:1. Different systems, such as Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} (using the above Lu:Si molar ratios), were synthesized by sol–gel and by dip-coating technique, employing acetylacetonate lutetium and tetraethylorthosilicate as Lu and Si precursors, in order to produce Lu{sub 2}O{sub 3}:Eu{sup 3+} (5 mol%)@SiO{sub 2} glass–ceramic films. The film microstructure was studied by microRaman spectroscopy (MRS) and X-ray diffraction (XRD) for different Lu:Si molar ratios on films annealed at 700 °C. X-ray diffraction results showed that the lutetiummore » oxide cubic phase crystallizes in the silica matrix at 700 °C, and the crystallite size of Lu{sub 2}O{sub 3}:Eu{sup 3+}@SiO{sub 2} films varies from 5 nm to 17 nm according to the respective Lu:Si molar ratios. Opto-geometrical parameters determined by m-lines spectroscopy using a 632.5 nm He–Ne laser showed that the Eu{sup 3+} doped films heat-treated at 700 °C presented a thickness and density of 1.7 μm (8.8 g cm{sup −3}), 970 nm (9.2 g cm{sup −3}), 1 μm (9.3 g cm{sup −3}) and 1.3 μm (9.25 g cm{sup −3}) for the Lu:Si = 4:1, 6:1, 8:1 and 10:1 molar ratio systems, respectively. The Lu:Si = 8:1 system 611 nm emission presented an improvement. These results were provided by photoluminescent spectroscopy.« less
Authors:
 [1] ;  [2] ;  [2] ;  [3] ;  [2] ;  [4] ;  [5] ;  [6]
  1. Alumna del posgrado en Tecnología Avanzada del IPN CIITEC Azcapotzalco (Mexico)
  2. Instituto Politécnico Nacional – CIITEC Azcapotzalco, Cerrada de Cecati S/N, Col. Santa Catarina, Del. Azcapotzalco, C.P. 02250 México, D.F. (Mexico)
  3. Departamento de Ciencias Naturales, DCNI, UAM Cuajimalpa, Pedro Antonio de los Santos 84, C.P. 11850 México, D.F. (Mexico)
  4. Instituto Politécnico Nacional, Centro de Investigación y de Estudios Avanzados (CINVESTAV), Departamento de Ingeniería Eléctrica (SEES), Av. Instituto Politécnico Nacional 2508, Col. San Pedro Zacatenco, C.P. 07360 México, D.F. Apartado Postal 14-740, 07000 México, D.F. (Mexico)
  5. Centro de Investigaciones en Óptica A.C., A.P. 1-94837150, León, Gto. (Mexico)
  6. Institut des Molécules et Matériaux du Mans, CNRS6283, Université du Maine, 72085 Le Mans Cedex 9 (France)
Publication Date:
OSTI Identifier:
22348620
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 51; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ANNEALING; CERAMICS; DOPED MATERIALS; ELECTRON MICROSCOPY; EUROPIUM IONS; GLASS; LUTETIUM OXIDES; MICROSTRUCTURE; PHOTOLUMINESCENCE; SILICA; SILICON OXIDES; SOL-GEL PROCESS; SOLUTIONS; SPECTROSCOPY; SUBSTRATES; SYNTHESIS; THICKNESS; X-RAY DIFFRACTION