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Title: Structural, thermal and spectroscopic properties of highly Er3+-doped novel oxyfluoride glasses for photonic application

Graphical abstract: - Highlights: • Er{sup 3+}-doped novel oxyfluoride glasses have been prepared by melt quenching technique. • Structural, thermal and spectroscopic properties have been carried out. • SALSFEr glasses exhibit intense green and weak red emissions at 365 nm excitation. • Major laser transition for Er{sup 3+} ion in SALSFEr glasses is {sup 4}I{sub 13/2} → {sup 4}I{sub 15/2} (1.53 μm). • These results suggest the possibility of using SALSFEr glasses as photonic devices. - Abstract: The Er{sup 3+}-doped novel oxyfluoride glasses of composition (43 − x)SiO{sub 2}–10Al{sub 2}O{sub 3}–24LiF–23SrF{sub 2}–xEr{sub 2}O{sub 3}, where x = 1.0, 2.0, 4.0 and 6.0 mol%, have been prepared by conventional melt quenching technique and are characterized through X-ray diffraction (XRD), differential thermal analysis (DTA), Raman, Fourier transform infrared (FT-IR) analysis, optical absorption spectra, visible (vis) and near-infrared (NIR) emission spectra measurements. Judd–Ofelt (JO) intensity parameters (Ω{sub λ}, λ = 2, 4 and 6) have been derived from the absorption spectrum of 1.0 mol% Er{sub 2}O{sub 3} doped glass and are in turn used to calculate radiative properties for the important luminescent levels of Er{sup 3+} ions. The studied glasses show intense green and weak red visible emissions under 365 nm excitation. Themore » decrease in visible emission intensities with concentration of Er{sup 3+} ions has been explained due to energy transfer processes between Er{sup 3+} ions. Upon excitation at 980 nm laser diode, an intense 1.53 μm NIR emission has been observed with the maximum full width at half maximum (FWHM) for Er{sup 3+}-doped oxyfluoride glasses. The higher Er{sup 3+} ion doping capability and relatively high gain and broad emission at 1.5 μm are the most notable features of these glasses to realize efficient short-length optical amplifiers.« less
Authors:
 [1] ; ;  [2] ;  [1] ;  [3] ;  [4]
  1. Department of Physics, Changwon National University, Changwon 641-773 (Korea, Republic of)
  2. Department of Physics, Sri Venkateswara University, Tirupati 517502 (India)
  3. Department of Chemistry, Changwon National University, Changwon 641-773 (Korea, Republic of)
  4. Department of Electronic Materials Engineering, Silla University, Busan 617-736 (Korea, Republic of)
Publication Date:
OSTI Identifier:
22348612
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 51; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ABSORPTION SPECTRA; DIFFERENTIAL THERMAL ANALYSIS; DOPED MATERIALS; EMISSION SPECTRA; ENERGY TRANSFER; ERBIUM IONS; ERBIUM OXIDES; EXCITATION; FOURIER TRANSFORMATION; GLASS; INFRARED SPECTRA; LUMINESCENCE; OPTICAL PROPERTIES; OXYFLUORIDES; SILICA; SILICON OXIDES; X-RAY DIFFRACTION