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Title: A new glass-free LTCC microwave ceramic – (1 − x) Li{sub 2.08}TiO{sub 3} + xLiF

Graphical abstract: - Highlights: • Sintering temperature of Li{sub 2}TiO{sub 3} was reduced to 900 °C by doping with LiF and excessive lithium. • A new glass-free LTCC microwave ceramic – (1 − x) Li{sub 2.08}TiO{sub 3} + xLiF was obtained. • The obtained LTCC material exhibited excellent microwave dielectric properties. - Abstract: The structure and microstructure of the (1 − x) Li{sub 2.08}TiO{sub 3} + xLiF (0.11 ≤ x ≤ 0.14) ceramics were studied by X-ray powder diffraction (XRD), thermal dilatometry and scanning electron microscopy (SEM). The microwave dielectric properties of the ceramics were studied with a network analyzer. All samples exhibited single monoclinic phase. The sintering temperature was successfully reduced to about 900 °C/2 h for the LiF-doped Li{sub 2.08}TiO{sub 3} specimens. The dielectric permittivity slightly decreased, whereas the Q × f value changed little, with the increase in LiF dopant. The temperature coefficient of resonant of frequency (τ{sub f}) value changed from positive to negative with increasing x, and a near zero value was obtained at x = 0.13 composition. Optimized microwave dielectric properties with ε{sub r} = ∼22.8, Q × f = ∼63,000 GHz and τ{sub f} = ∼1.0 ppm/°C for x = 0.13 composition sinteredmore » at 900 °C/2 h. The XRD and back scattering SEM analysis showed that the ceramic was compatible with Ag powders after sintering at 900 °C/2 h.« less
Authors:
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Publication Date:
OSTI Identifier:
22341877
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Research Bulletin; Journal Volume: 49; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; CERAMICS; DILATOMETRY; DOPED MATERIALS; GLASS; LITHIUM FLUORIDES; LITHIUM TITANATES; MICROSTRUCTURE; MONOCLINIC LATTICES; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SINTERING; TEMPERATURE COEFFICIENT; X-RAY DIFFRACTION