The influence of Cd doping on the microstructure and optical properties of nanocrystalline copper ferrite thin films
- Physics Department, Faculty of Science, Helwan University, 11792 Helwan, Cairo (Egypt)
- Physics Department, Faculty of Science, Al-Azhar University, Assuit (Egypt)
- Physics Department, College of Science, Qassim University, P.O. 6644, 5145 Buryadh (Saudi Arabia)
Highlights: ► The structural and optical properties of Cu{sub 1−x}Cd{sub x}Fe{sub 2}O{sub 4} thin films were studied. ► The micro structural parameters of the films have been determined. ► The room temperature reflectance and transmittance data are analyzed. ► The refractive index and energy gap are determined. ► The single oscillator parameters were calculated. - Abstract: Nanocrystalline thin films of mixed Cu–Cd ferrites, Cu{sub 1−x}Cd{sub x}Fe{sub 2}O{sub 4} (x = 0, 0.2, 0.3, 0.5, 0.7, 0.8, 0.9 and 1), were deposited by electron beam evaporation technique. The films were annealed at 450 °C for 1 h. The effect of Cd doping on the structural and optical properties of the deposited films has been investigated by using X-ray diffraction (XRD) and optical spectrophotometry. XRD patterns of the annealed films show spinal cubic structure. The lattice parameter was found to increase with the increase of cadmium concentration. The crystallite size of the films was found to vary from 8 nm to 30 nm. The optical transition was found to be direct and indirect transitions with energy gaps decrease from 2.466 (x = 0) to 2.00 (x = 1) eV and from 2.148 (x = 0) to 1.824 (x = 1) eV, respectively. The refractive index dispersion of the films was found to increase with Cd content and discussed in terms of the Wemple–DiDomenico single oscillator model.
- OSTI ID:
- 22341698
- Journal Information:
- Materials Research Bulletin, Vol. 48, Issue 6; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA); ISSN 0025-5408
- Country of Publication:
- United States
- Language:
- English
Similar Records
Determination of dispersive optical constants of nanocrystalline CdSe (nc-CdSe) thin films
Structural characterization and novel optical properties of defect chalcopyrite ZnGa{sub 2}Te{sub 4} thin films