skip to main content

Title: Triple ion beam cutting of diamond/Al composites for interface characterization

A novel triple ion beam cutting technique was employed to prepare high-quality surfaces of diamond/Al composites for interfacial characterization, which has been unachievable so far. Near-perfect and artifact-free surfaces were obtained without mechanical pre-polishing. Hence, the as-prepared surfaces are readily available for further study and also, ready to be employed in a focus ion beam system for preferential selection of transmission electron microscopy samples. Dramatically different diamond/Al interface configurations — sub-micrometer Al{sub 2}O{sub 3} particles and clean interfaces were unambiguously revealed. - Highlights: • A new triple ion beam technique was employed to prepare diamond/Al composites. • Near-perfect and artifact-free surfaces were obtained for interface characterization. • Sub-micrometer Al{sub 2}O{sub 3} particles and clean interfaces were unambiguously revealed.
Authors:
 [1] ;  [2] ;  [3] ;  [1] ;  [3] ;  [4] ;  [1] ;  [5] ;  [3]
  1. Unité Matériaux et Transformations, UMR CNRS 8207, Bâtiment C6, Université Lille 1, 59655 Villeneuve d'Ascq (France)
  2. (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp (Belgium)
  3. State Key Laboratory of Metal Matrix Composites, Shanghai Jiao Tong University, Shanghai 200240 (China)
  4. Leica Mikrosysteme GmbH, Physikneubau, Reichenhainer Straße 70, DE-09126 Chemnitz (Germany)
  5. Electron Microscopy for Materials Science (EMAT), University of Antwerp, Groenenborgerlaan 171, 2020 Antwerp (Belgium)
Publication Date:
OSTI Identifier:
22340339
Resource Type:
Journal Article
Resource Relation:
Journal Name: Materials Characterization; Journal Volume: 89; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; ALUMINIUM OXIDES; CUTTING; ION BEAMS; PARTICLES; TRANSMISSION ELECTRON MICROSCOPY