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Title: Comparison of the structural and optical properties of porous In{sub 0.08}Ga{sub 0.92}N thin films synthesized by electrochemical etching

This paper presents the structural and optical study of porous (1 µm) In{sub 0.08}Ga{sub 0.92}N synthesized by photoelectrochemical etching under various conditions. Field emission scanning electron microscope and atomic force microscope images showed that the pre-etched thin films have a sufficiently smooth surface over a large region with wurtzite structure. The roughness increased with an increase in etching duration. The blue shift phenomenon was measured for photoluminescence emission peaks at 300 K. The energy band gap increased to be 3.18 and 3.16 eV for post-etched films at ratios of 1:4 and 1:5, respectively. At the same time, the photoluminescence intensities of the post-etched thin films indicated that the optical properties have been enhanced. - Graphical abstract: PL spectra of the as-grown and porous In{sub 0.08}Ga{sub 0.92}N under various etching duration. - Highlights: • Nanoporous structures of In{sub 0.08}Ga{sub 0.92}N. • The roughness of the porous thin films increased with an increase in etching durations. • No phase segregation in XRD pattern. • Blue shifts were observed in the PL spectra of the post-etched films.
Authors:
 [1] ;  [2] ; ;  [1] ;  [3]
  1. Nano-Optoelectronics Research and Technology (N.O.R.) Laboratory, School of Physics, Universiti Sains Malaysia, 11800 Penang (Malaysia)
  2. (Iraq)
  3. Department of Physics, College of Science, Thi-Qar University (Iraq)
Publication Date:
OSTI Identifier:
22334189
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Solid State Chemistry; Journal Volume: 212; Other Information: Copyright (c) 2013 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
37 INORGANIC, ORGANIC, PHYSICAL AND ANALYTICAL CHEMISTRY; ATOMIC FORCE MICROSCOPY; FIELD EMISSION; OPTICAL PROPERTIES; PHOTOLUMINESCENCE; POROUS MATERIALS; SCANNING ELECTRON MICROSCOPY; SPECTRA; THIN FILMS; X-RAY DIFFRACTION