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Title: An X-ray photoelectron spectroscopy study of the hydration of C{sub 2}S thin films

Electron-beam evaporation was used to produce thin films of β-dicalcium silicate. Chemical and mineralogical compositions were characterized by X-ray photoelectron spectroscopy (XPS) and grazing-angle X-ray diffraction (GAXRD), respectively. Results show that no fractionation occurs during evaporation and isostructural condensation of the material as synthesized films have the same composition as the initial bulk material. Samples were gradually hydrated under saturated water spray conditions and analyzed with XPS. Polymerization of the silicate chains due to hydration, and subsequent formation of C-S-H, has been monitored through evaluation of energy shifts on characteristic silicon peaks. Quantitative analyses show changes on the surface by the reduction of the Ca/Si ratio and an increase on the difference between binding energies of bridging and non-bridging oxygen. Finally, SEM/FIB observation shows clear differences between the surface and cross section of the initial sample and the reacted sample.
Authors:
 [1] ;  [2]
  1. Department of Civil and Environmental Engineering, National University of Singapore, 1 Engineering Drive 2, Singapore 117576 (Singapore)
  2. Department of Construction Engineering, Institute for Energy Technologies (INTE) and Center for Research in Nanoengineering, Universitat Politècnica de Catalunya—BarcelonaTech, Campus Nord, B1-109C, 08034 Barcelona (Spain)
Publication Date:
OSTI Identifier:
22323146
Resource Type:
Journal Article
Resource Relation:
Journal Name: Cement and Concrete Research; Journal Volume: 60; Other Information: Copyright (c) 2014 Elsevier Science B.V., Amsterdam, The Netherlands, All rights reserved.; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BINDING ENERGY; CALCIUM SILICATES; CROSS SECTIONS; ELECTRON BEAMS; EVALUATION; EVAPORATION; HYDRATION; PEAKS; POLYMERIZATION; SCANNING ELECTRON MICROSCOPY; THIN FILMS; X-RAY DIFFRACTION; X-RAY PHOTOELECTRON SPECTROSCOPY