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Title: Low loss factor Co{sub 2}Z ferrite composites with equivalent permittivity and permeability for ultra-high frequency applications

Ferrite composites of nominal composition Ba{sub 3}Co{sub 2+x}Ir{sub x}Fe{sub 24−2x}O{sub 41} were studied in order to achieve low magnetic and dielectric losses and equivalent permittivity and permeability over a frequency range of 0.3–1 GHz. Crystallographic structure was characterized by X-ray diffraction, which revealed a Z-type phase accompanied by increasing amounts of Y-type phase as the iridium amount was increased. The measured microwave dielectric and magnetic properties showed that the loss tan δ{sub ε} and loss tan δ{sub μ} decreased by 80% and 90% at 0.8 GHz with the addition of iridium of x = 0.12 and 0.15, respectively. An effective medium approximation was adopted to analyze the composite ferrites having mixed phase structures. Moreover, adding Bi{sub 2}O{sub 3} enabled equivalent values of real permittivity and real permeability over the studied frequency range. The resultant data give rise to low loss factors, i.e., tan δ{sub ε}/ε′ = 0.008 and tan δ{sub μ}/μ′ = 0.037 at 0.8 GHz, while characteristic impedance was the same as that of free space.
Authors:
; ; ; ; ;  [1] ;  [1] ;  [2]
  1. Center for Microwave Magnetic Materials and Integrated Circuits, Northeastern University, Boston, Massachusetts 02115, USA and the Department of Electrical and Computer Engineering, Northeastern University, Boston, Massachusetts 02115 (United States)
  2. (China)
Publication Date:
OSTI Identifier:
22318003
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; BARIUM CARBONATES; BISMUTH OXIDES; CRYSTALLOGRAPHY; DIELECTRIC MATERIALS; FERRITE; IRIDIUM; MAGNETIC PROPERTIES; MICROWAVE RADIATION; PERMEABILITY; PERMITTIVITY; X-RAY DIFFRACTION