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Title: Study of Pyrex and quartz insulators contamination effect on the X-ray intensity in a 4-kJ plasma focus device

The variation of the X-ray intensity has been investigated with the Pyrex and quartz insulators surface contamination in a 4-kJ plasma focus device with argon gas at 11.5-kV charging voltage. Elemental analysis (EDAX) showed that the Cu evaporated from the electrode material and was deposited on the sleeve surface improves the breakdown conditions. A small level of sleeve contamination by copper is found to be essential for good focusing action and high HXR intensity. The SEM imaging showed the grain-type structure of Cu formed on the surface and it changed the surface property. Resistance measurements of original and coated Pyrex surface proved that the copper deposition on the sleeve surface will reduce its resistance as compared to the almost infinitely large resistance of the uncontaminated sleeve. As the contamination is surpassed to some critical level, the HXR intensity from the device is deteriorated.
Authors:
; ;  [1]
  1. Amirkabir University of Technology, Department of Energy Engineering and Physics (Iran, Islamic Republic of)
Publication Date:
OSTI Identifier:
22314757
Resource Type:
Journal Article
Resource Relation:
Journal Name: Plasma Physics Reports; Journal Volume: 39; Journal Issue: 12; Other Information: Copyright (c) 2013 Pleiades Publishing, Ltd.; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 70 PLASMA PHYSICS AND FUSION TECHNOLOGY; ARGON; BREAKDOWN; COPPER; DEPOSITION; PLASMA FOCUS DEVICES; PYREX; QUARTZ; SURFACE CONTAMINATION; X RADIATION