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Title: Deformation T-Cup: A new multi-anvil apparatus for controlled strain-rate deformation experiments at pressures above 18 GPa

A new multi-anvil deformation apparatus, based on the widely used 6-8 split-cylinder, geometry, has been developed which is capable of deformation experiments at pressures in excess of 18 GPa at room temperature. In 6-8 (Kawai-type) devices eight cubic anvils are used to compress the sample assembly. In our new apparatus two of the eight cubes which sit along the split-cylinder axis have been replaced by hexagonal cross section anvils. Combining these anvils hexagonal-anvils with secondary differential actuators incorporated into the load frame, for the first time, enables the 6-8 multi-anvil apparatus to be used for controlled strain-rate deformation experiments to high strains. Testing of the design, both with and without synchrotron-X-rays, has demonstrated the Deformation T-Cup (DT-Cup) is capable of deforming 1–2 mm long samples to over 55% strain at high temperatures and pressures. To date the apparatus has been calibrated to, and deformed at, 18.8 GPa and deformation experiments performed in conjunction with synchrotron X-rays at confining pressures up to 10 GPa at 800 °C.
Authors:
; ; ;  [1] ; ; ; ;  [2]
  1. Department of Earth Sciences, University College London, Gower Street, London WC1E 6BT (United Kingdom)
  2. Mineral Physics Institute, Stony Brook University, Stony Brook, New York 11794-2100 (United States)
Publication Date:
OSTI Identifier:
22314668
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 8; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ACTUATORS; CALIBRATION; DEFORMATION; PRESSURE RANGE GIGA PA; PRESSURE RANGE MEGA PA 10-100; STRAIN RATE; SYNCHROTRONS; TEMPERATURE RANGE 0273-0400 K; TEMPERATURE RANGE 0400-1000 K; TESTING; X RADIATION