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Title: A low temperature nonlinear optical rotational anisotropy spectrometer for the determination of crystallographic and electronic symmetries

Nonlinear optical generation from a crystalline material can reveal the symmetries of both its lattice structure and underlying ordered electronic phases and can therefore be exploited as a complementary technique to diffraction based scattering probes. Although this technique has been successfully used to study the lattice and magnetic structures of systems such as semiconductor surfaces, multiferroic crystals, magnetic thin films, and multilayers, challenging technical requirements have prevented its application to the plethora of complex electronic phases found in strongly correlated electron systems. These requirements include an ability to probe small bulk single crystals at the μm length scale, a need for sensitivity to the entire nonlinear optical susceptibility tensor, oblique light incidence reflection geometry, and incident light frequency tunability among others. These measurements are further complicated by the need for extreme sample environments such as ultra low temperatures, high magnetic fields, or high pressures. In this review we present a novel experimental construction using a rotating light scattering plane that meets all the aforementioned requirements. We demonstrate the efficacy of our scheme by making symmetry measurements on a μm scale facet of a small bulk single crystal of Sr{sub 2}IrO{sub 4} using optical second and third harmonic generation.
Authors:
;  [1] ;  [2] ;  [1] ;  [2] ; ;  [3]
  1. Institute for Quantum Information and Matter, California Institute of Technology, Pasadena, California 91125 (United States)
  2. (United States)
  3. Center for Advanced Materials, Department of Physics and Astronomy, University of Kentucky, Lexington, Kentucky 40506 (United States)
Publication Date:
OSTI Identifier:
22314648
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 8; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ANISOTROPY; CRYSTALLOGRAPHY; DIFFRACTION; ELECTRON CORRELATION; HARMONIC GENERATION; LIGHT SCATTERING; MAGNETIC FIELDS; MONOCRYSTALS; NONLINEAR PROBLEMS; PRESSURE RANGE MEGA PA 10-100; SEMICONDUCTOR MATERIALS; SENSITIVITY; SPECTROMETERS; SYMMETRY; TEMPERATURE RANGE 0065-0273 K; THIN FILMS