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Title: Nanoscale characterization of β-phase H{sub x}Li{sub 1−x}NbO{sub 3} layers by piezoresponse force microscopy

We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO{sub 3} with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d{sub 33} coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO{sub 3} value, for undoped and 5 mol. % MgO-doped substrates, respectively.
Authors:
;  [1] ; ;  [2]
  1. KTH—Royal Institute of Technology, Department of Applied Physics, 106 91 Stockholm (Sweden)
  2. University College Dublin, School of Physics, Belfield, Dublin 4 (Ireland)
Publication Date:
OSTI Identifier:
22314643
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DOPED MATERIALS; LAYERS; LITHIUM COMPOUNDS; MAGNESIUM OXIDES; MICROSCOPY; NANOSTRUCTURES; NIOBATES; NIOBIUM OXIDES; PIEZOELECTRICITY; PROTONS; REFRACTIVE INDEX; SUBSTRATES