Nanoscale characterization of β-phase H{sub x}Li{sub 1−x}NbO{sub 3} layers by piezoresponse force microscopy

Journal Article · Thu Aug 14 00:00:00 EDT 2014 · Journal of Applied Physics

DOI:https://doi.org/10.1063/1.4891352· OSTI ID:22314643

Manzo, Michele; Gallo, Katia ^[1]; Denning, Denise; Rodriguez, Brian J. ^[2]

---

1. KTH—Royal Institute of Technology, Department of Applied Physics, 106 91 Stockholm (Sweden)
2. University College Dublin, School of Physics, Belfield, Dublin 4 (Ireland)

We investigate a non-destructive approach for the characterization of proton exchanged layers in LiNbO{sub 3} with sub-micrometric resolution by means of piezoresponse force microscopy (PFM). Through systematic analyses, we identify a clear correlation between optical measurements on the extraordinary refractive index and PFM measurements on the piezoelectric d{sub 33} coefficient. Furthermore, we quantify the reduction of the latter induced by proton exchange as 83 ± 2% and 68 ± 3% of the LiNbO{sub 3} value, for undoped and 5 mol. % MgO-doped substrates, respectively.

• OSTI ID: 22314643
• Journal Information: Journal of Applied Physics, Vol. 116, Issue 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0021-8979
• Country of Publication: United States
• Language: English

Related Subjects

36 MATERIALS SCIENCE
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
DOPED MATERIALS
LAYERS
LITHIUM COMPOUNDS
MAGNESIUM OXIDES
MICROSCOPY
NANOSTRUCTURES
NIOBATES
NIOBIUM OXIDES
PIEZOELECTRICITY
PROTONS
REFRACTIVE INDEX
SUBSTRATES