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Title: Magnetic properties of Sm-Co thin films grown on MgO(100) deposited from a single alloy target

We have grown epitaxial Sm-Co thin films by sputter deposition from a single alloy target with a nominal SmCo{sub 5} composition on Cr(100)-buffered MgO(100) single-crystal substrates. By varying the Ar gas pressure, we can change the composition of the film from a SmCo{sub 5}-like to a Sm{sub 2}Co{sub 7}-like phase. The composition, crystal structure, morphology, and magnetic properties of these films have been determined using Rutherford Backscattering, X-ray diffraction, and magnetization measurements. We find that we can grow films with, at room temperature, coercive fields as high as 3.3‚ÄČT, but with a remanent magnetization which is lower than can be expected from the texturing. This appears to be due to the Sm content of the films, which is higher than expected from the content of the target, even at the lowest possible sputtering pressures. Moreover, we find relatively large variations of film properties using targets of nominally the same composition. At low temperatures, the coercive fields increase, as expected for these hard magnets, but in the magnetization, we observe a strong background signal from the paramagnetic impurities in the MgO substrates.
Authors:
; ; ;  [1]
  1. Huygens-Kamerlingh Onnes Laboratorium, Universiteit Leiden, P.O. Box 9504, 2300 RA Leiden (Netherlands)
Publication Date:
OSTI Identifier:
22314551
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ALLOYS; BUFFERS; CRYSTAL STRUCTURE; DEPOSITION; DEPOSITS; EPITAXY; IMPURITIES; MAGNESIUM OXIDES; MAGNETIC PROPERTIES; MAGNETIZATION; MONOCRYSTALS; MORPHOLOGY; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SIGNALS; SPUTTERING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION