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Title: Single-layer MoS{sub 2} roughness and sliding friction quenching by interaction with atomically flat substrates

We experimentally study the surface roughness and the lateral friction force in single-layer MoS{sub 2} crystals deposited on different substrates: SiO{sub 2}, mica, and hexagonal boron nitride (h-BN). Roughness and sliding friction measurements are performed by atomic force microscopy. We find a strong dependence of the MoS{sub 2} roughness on the underlying substrate material, being h-BN the substrate which better preserves the flatness of the MoS{sub 2} crystal. The lateral friction also lowers as the roughness decreases, and attains its lowest value for MoS{sub 2} flakes on h-BN substrates. However, it is still higher than for the surface of a bulk MoS{sub 2} crystal, which we attribute to the deformation of the flake due to competing tip-to-flake and flake-to-substrate interactions.
Authors:
 [1] ;  [2] ;  [1] ;  [3] ;  [3] ;  [4] ;  [1] ;  [3] ;  [4]
  1. Departamento de Física de la Materia Condensada, Universidad Autónoma de Madrid, Madrid E-28049 (Spain)
  2. Kavli Institute of Nanoscience, Delft University of Technology, Lorentzweg 1, 2628 CJ Delft (Netherlands)
  3. (Spain)
  4. (IFIMAC), Universidad Autónoma de Madrid, E-28049 Madrid (Spain)
Publication Date:
OSTI Identifier:
22314510
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; ATOMIC FORCE MICROSCOPY; BORON NITRIDES; CRYSTALS; MICA; MOLYBDENUM SULFIDES; QUENCHING; ROUGHNESS; SILICON OXIDES; SLIDING FRICTION; SUBSTRATES