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Title: Enhanced reflection from inverse tapered nanocone arrays

We computationally and experimentally demonstrate enhanced reflection effects displayed by silicon-based inverted nanocone arrays. A 3D finite element model is used to characterize the optical properties of the nanocone arrays with respect to the change in polarization and incident angles. The nanocone arrays are fabricated by e-beam lithography in hexagonal and triangular geometries with a lattice constant of 300 nm. The fabricated devices show a two-fold increase in reflection compared with bare silicon surface, as well as a strong diffraction within the visible and near-infrared spectra. The nanocone arrays may find a variety of applications from optical devices to energy conservation technologies.
Authors:
;  [1] ; ;  [2] ; ;  [3] ; ; ; ;  [4]
  1. National Center for Nanoscience and Technology, Beijing 100190 (China)
  2. School of Mechanical Engineering, University of Birmingham, Edgbaston, Birmingham B15 2TT (United Kingdom)
  3. Department of Chemical Engineering and Biotechnology, University of Cambridge, Tennis Court Road, Cambridge CB2 1QT (United Kingdom)
  4. Electrical Engineering Division, Department of Engineering, University of Cambridge, Cambridge CB3 0FA (United Kingdom)
Publication Date:
OSTI Identifier:
22314507
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; DIFFRACTION; ELECTRON BEAMS; ENERGY CONSERVATION; FINITE ELEMENT METHOD; INFRARED SPECTRA; LATTICE PARAMETERS; NANOSTRUCTURES; OPTICAL PROPERTIES; REFLECTION; SILICON