skip to main content

Title: Atomic scale investigations on Cd{sub x}Zn{sub 1−x}Se quantum dots: Correlation between the composition and emission properties

Atom probe tomography and photoluminescence spectroscopy have been used to study Cd{sub x}Zn{sub 1−x}Se quantum dots embedded in a ZnSe layer grown on a (001) GaAs substrate. Atom probe tomography analyses show significant cadmium incorporation in the center of the dots surrounded by poor cadmium region. These measurements illustrate that the maximum cadmium concentration in the quantum dots is significantly higher than the concentration estimated by transmission electron microscopy. The composition and size of quantum dots obtained by atom probe tomography have been used to calculate the transition energies including excitonic and strain effects.
Authors:
; ;  [1] ; ; ; ;  [2] ;  [3] ;  [3]
  1. Aix-Marseille Université, IM2NP-CNRS, Case 142, 13397 Marseille Cedex 20 (France)
  2. University of Grenoble Alpes, F-38000 Grenoble (France)
  3. (France)
Publication Date:
OSTI Identifier:
22314505
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
36 MATERIALS SCIENCE; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CADMIUM; GALLIUM ARSENIDES; LAYERS; PHOTOLUMINESCENCE; QUANTUM DOTS; SPECTROSCOPY; TOMOGRAPHY; TRANSMISSION ELECTRON MICROSCOPY; ZINC SELENIDES