skip to main content

SciTech ConnectSciTech Connect

Title: Invited Article: Characterization of background sources in space-based time-of-flight mass spectrometers

For instruments that use time-of-flight techniques to measure space plasma, there are common sources of background signals that evidence themselves in the data. The background from these sources may increase the complexity of data analysis and reduce the signal-to-noise response of the instrument, thereby diminishing the science value or usefulness of the data. This paper reviews several sources of background commonly found in time-of-flight mass spectrometers and illustrates their effect in actual data using examples from ACE-SWICS and MESSENGER-FIPS. Sources include penetrating particles and radiation, UV photons, energy straggling and angular scattering, electron stimulated desorption of ions, ion-induced electron emission, accidental coincidence events, and noise signatures from instrument electronics. Data signatures of these sources are shown, as well as mitigation strategies and design considerations for future instruments.
Authors:
; ; ; ;  [1] ; ;  [2] ;  [3]
  1. Department of Atmospheric, Oceanic and Space Sciences, University of Michigan, 2455 Hayward St, Ann Arbor, Michigan 48109 (United States)
  2. Georgia Institute of Technology, 225 North Ave NW, Atlanta, Georgia 30332 (United States)
  3. International Space Science Institute, Hallerstrasse 6, CH-3012 Bern, Switzerland and Physikalisches Institut, Universit├Ąt Bern, Sidlerstrasse 5, CH-3012 Bern (Switzerland)
Publication Date:
OSTI Identifier:
22314438
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 9; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BACKGROUND NOISE; DATA ANALYSIS; DESORPTION; ELECTRON EMISSION; IONS; PHOTONS; SCATTERING; SIGNAL-TO-NOISE RATIO; TIME-OF-FLIGHT MASS SPECTROMETERS