Multilayer graphene stacks grown by different methods-thickness measurements by X-ray diffraction, Raman spectroscopy and optical transmission

Journal Article · Sun Dec 15 00:00:00 EST 2013 · Crystallography Reports

DOI:https://doi.org/10.1134/S1063774513070195· OSTI ID:22311413

Kowalski, G.; Kępa, H.; Grodecki, K.; Drabińska, A. ^[1]; Strupiński, W. ^[2]

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1. University of Warsaw, Institute of Experimental Physics, Faculty of Physics (Poland)
2. Institute of Electronic Materials Technology (Poland)

X-ray diffraction, Raman spectroscopy and Optical absorption estimates of the thickness of graphene multi layer stacks (number of graphene layers) are presented for three different growth techniques. The objective of this work was focused on comparison and reconciliation of the two already widely used methods for thickness estimates (Raman and Absorption) with the calibration of the X-ray method as far as Scherer constant K is concerned and X-ray based Wagner-Aqua extrapolation method.

• OSTI ID: 22311413
• Journal Information: Crystallography Reports, Vol. 58, Issue 7; Other Information: Copyright (c) 2013 Pleiades Publishing, Inc.; http://www.springer-ny.com; Country of input: International Atomic Energy Agency (IAEA); ISSN 1063-7745
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CRYSTAL GROWTH
GRAPHENE
RAMAN SPECTROSCOPY
THICKNESS
X RADIATION
X-RAY DIFFRACTION