skip to main content

SciTech ConnectSciTech Connect

Title: Low-temperature phase transitions in a soluble oligoacene and their effect on device performance and stability

The use of organic semiconductors in high-performance organic field-effect transistors requires a thorough understanding of the effects that processing conditions, thermal, and bias-stress history have on device operation. Here, we evaluate the temperature dependence of the electrical properties of transistors fabricated with 2,8-difluoro-5,11-bis(triethylsilylethynyl)anthradithiophene, a material that has attracted much attention recently due to its exceptional electrical properties. We have discovered a phase transition at T = 205 K and discuss its implications on device performance and stability. We examined the impact of this low-temperature phase transition on the thermodynamic, electrical, and structural properties of both single crystals and thin films of this material. Our results show that while the changes to the crystal structure are reversible, the induced thermal stress yields irreversible degradation of the devices.
Authors:
; ; ; ;  [1] ; ;  [2] ;  [3]
  1. Department of Physics, Wake Forest University, Winston-Salem, North Carolina 27109 (United States)
  2. Department of Chemistry, University of Kentucky, Lexington, Kentucky 40506 (United States)
  3. Department of Chemistry, Wake Forest University, Winston-Salem, North Carolina 27109 (United States)
Publication Date:
OSTI Identifier:
22311351
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 8; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; CRYSTAL STRUCTURE; ELECTRICAL PROPERTIES; FIELD EFFECT TRANSISTORS; MONOCRYSTALS; ORGANIC SEMICONDUCTORS; PHASE TRANSFORMATIONS; STABILITY; TEMPERATURE DEPENDENCE; TEMPERATURE RANGE 0065-0273 K; THERMAL STRESSES; THIN FILMS; TRANSITION TEMPERATURE