Circular grating interferometer for mapping transverse coherence area of X-ray beams

Journal Article · Mon Jul 28 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4892002· OSTI ID:22311186

Shi, Xianbo; Marathe, Shashidhara; Wojcik, Michael J.; Kujala, Naresh G.; Macrander, Albert T.; Assoufid, Lahsen ^[1]

---

1. Advanced Photon Source, Argonne National Laboratory, 9700 S Cass Ave, Lemont, Illinois 60439 (United States)

A circular grating interferometer was used to map the transverse coherence area of an X-ray beam. Due to the radial symmetry of the circular grating, coherence lengths along all transverse directions were obtained simultaneously by measuring the visibility decay of interferograms recorded at different distances behind a single circular π/2 phase grating. The technique is model-free and provides direct measurement of the complex coherence factor of the beam. The use of a circular grating also enables the unique capability of measuring the source shape profile. Sensitivity of this technique was demonstrated by detecting the small source tilt of a few degrees.

• OSTI ID: 22311186
• Journal Information: Applied Physics Letters, Vol. 105, Issue 4; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
BEAMS
COHERENCE LENGTH
DECAY
INTERFEROMETERS
SENSITIVITY
SYMMETRY
VISIBILITY
X RADIATION