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Title: High precision measurement of undulator polarization in the regime of hard x-rays

We have measured the polarization purity of undulator radiation at 12.9 keV, with hitherto unachievable precision. We could measure a polarization purity of 1.8 × 10{sup −4} by using a silicon channel-cut crystal with six Bragg reflections at 45° as analyzer.
Authors:
 [1] ; ; ; ; ; ;  [1] ;  [2] ; ; ; ;  [3] ;  [4]
  1. Institut für Optik und Quantenelektronik, Friedrich-Schiller-Universität Jena, Max-Wien-Platz 1, D-07743 Jena (Germany)
  2. (Germany)
  3. Deutsches Elektronen-Synchrotron DESY, Notkestr. 85, D-22607 Hamburg (Germany)
  4. Helmholtz-Institut Jena, Fröbelstieg 3, D-07743 Jena (Germany)
Publication Date:
OSTI Identifier:
22311112
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ACCURACY; BRAGG REFLECTION; CRYSTALS; HARD X RADIATION; IMPURITIES; KEV RANGE 10-100; POLARIZATION; SILICON; WIGGLER MAGNETS