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Title: Investigation of ferroelectric domains in thin films of vinylidene fluoride oligomers

High-resolution vector piezoresponse force microscopy (PFM) has been used to investigate ferroelectric domains in thin vinylidene fluoride oligomer films fabricated by the Langmuir-Blodgett deposition technique. Molecular chains are found to be preferentially oriented normal to the substrate, and PFM imaging shows that the films are in ferroelectric β-phase with a predominantly in-plane polarization, in agreement with infrared spectroscopic ellipsometry and X-ray diffraction measurements. The fractal analysis of domain structure has yielded the Hausdorff dimension (D) in the range of ∼1.3–1.5 indicating a random-bond nature of the disorder potential, with domain size exhibiting Landau-Lifshitz-Kittel scaling.
Authors:
; ; ;  [1] ;  [2]
  1. Department of Physics and Astronomy, and Nebraska Center for Materials and Nanoscience, University of Nebraska-Lincoln, Nebraska 68588 (United States)
  2. Department of Electrical Engineering and Center for Nanohybrid Functional Materials, University of Nebraska-Lincoln, Nebraska 68588 (United States)
Publication Date:
OSTI Identifier:
22311093
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 2; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; DEPOSITION; DOMAIN STRUCTURE; ELLIPSOMETRY; FERROELECTRIC MATERIALS; MICROSCOPY; POLARIZATION; RANDOMNESS; RESOLUTION; SCALING; SUBSTRATES; THIN FILMS; X-RAY DIFFRACTION