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Title: Electromagnetic model for near-field microwave microscope with atomic resolution: Determination of tunnel junction impedance

An electrodynamic model is proposed for the tunneling microwave microscope with subnanometer space resolution as developed by Lee et al. [Appl. Phys. Lett. 97, 183111 (2010)]. Tip-sample impedance Z{sub a} was introduced and studied in the tunneling and non-tunneling regimes. At tunneling breakdown, the microwave current between probe and sample flows along two parallel channels characterized by impedances Z{sub p} and Z{sub t} that add up to form overall impedance Z{sub a}. Quantity Z{sub p} is the capacitive impedance determined by the near field of the probe and Z{sub t} is the impedance of the tunnel junction. By taking into account the distance dependences of effective tip radius r{sub 0}(z) and tunnel resistance R{sub t}(z) = Re[Z{sub t}(z)], we were able to explain the experimentally observed dependences of resonance frequency f{sub r}(z) and quality factor Q{sub L}(z) of the microscope. The obtained microwave resistance R{sub t}(z) and direct current tunnel resistance R{sub t}{sup dc}(z) exhibit qualitatively similar behavior, although being largely different in both magnitude and the characteristic scale of height dependence. Interpretation of the microwave images of the atomic structure of test samples proved possible by taking into account the inductive component of tunnel impedance ImZ{sub t} = ωL{sub t}. Relation ωL{sub t}/R{submore » t} ≈ 0.235 was obtained.« less
Authors:
 [1]
  1. Institute for Physics of Microstructures of the Russian Academy of Sciences, GSP-105, Nizhniy Novgorod 603950, Russia, and Lobachevsky State University of Nizhny Novgorod, 23, pr. Gagarina, N. Novgorod 603950 (Russian Federation)
Publication Date:
OSTI Identifier:
22310989
Resource Type:
Journal Article
Resource Relation:
Journal Name: Applied Physics Letters; Journal Volume: 105; Journal Issue: 8; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BREAKDOWN; DIRECT CURRENT; DISTANCE; ELECTRODYNAMICS; HEIGHT; IMAGES; IMPEDANCE; MICROSCOPES; MICROWAVE RADIATION; PROBES; QUALITY FACTOR; RESOLUTION; SIMULATION; SPACE; SUPERCONDUCTING JUNCTIONS; TUNNEL DIODES; TUNNEL EFFECT