skip to main content
OSTI.GOV title logo U.S. Department of Energy
Office of Scientific and Technical Information

Title: Light-induced degradation and metastable-state recovery with reaction kinetics modeling in boron-doped Czochralski silicon solar cells

Journal Article · · Applied Physics Letters
DOI:https://doi.org/10.1063/1.4894289· OSTI ID:22310987
; ; ; ; ;  [1]; ;  [2];  [3]
  1. Department of Materials Science and Engineering, Korea University, Anam-dong, Seongbuk-gu, Seoul 136-701 (Korea, Republic of)
  2. Korea Institute of Energy Research, 152 Gajeong-ro, Yuseong-gu, Daejeon 305-343 (Korea, Republic of)
  3. KU-KIST Green School, Graduate School of Energy and Environment, Korea University, Anam-dong, Seongbuk-gu, Seoul 136-701 (Korea, Republic of)

Solar cells fabricated from boron-doped p-type Czochralski silicon suffer from light-induced degradation that can lower the conversion efficiency by up to 10% relative. When solar cells are exposed to temperatures between 100 °C and 200 °C under illumination, regeneration, in which the minority carrier lifetime is gradually recovered, occurs after the initial light-induced degradation. We studied the light-induced degradation and regeneration process using carrier injection within a design chamber and observed open-circuit voltage trends at various sample temperatures. We proposed a cyclic reaction kinetics model to more precisely analyze the degradation and recovery phenomenon. Our model incorporated the reaction paths that were not counted in the original model between the three states (annealed, degradation, and regeneration). We calculated a rate constant for each reaction path based on the proposed model, extracted an activation energy for each reaction using these rate constants at various temperatures, and calculated activation energies of redegradation and the stabilization reaction.

OSTI ID:
22310987
Journal Information:
Applied Physics Letters, Vol. 105, Issue 8; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
Country of Publication:
United States
Language:
English