Measuring the complex admittance of a nearly isolated graphene quantum dot

Journal Article · Mon Aug 18 00:00:00 EDT 2014 · Applied Physics Letters

DOI:https://doi.org/10.1063/1.4893883· OSTI ID:22310922

Zhang, Miao-Lei; Wei, Da; Deng, Guang-Wei; Li, Shu-Xiao; Li, Hai-Ou; Cao, Gang; Tu, Tao; Xiao, Ming; Guo, Guang-Can; Guo, Guo-Ping ^[1]; Jiang, Hong-Wen ^[2]

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1. Key Laboratory of Quantum Information, Synergetic Innovation Center of Quantum Information and Quantum Physics, University of Science and Technology of China, Chinese Academy of Sciences, Hefei 230026 (China)
2. Department of Physics and Astronomy, University of California at Los Angeles, Los Angeles, California 90095 (United States)

We measured the radio-frequency reflection spectrum of an on-chip reflection line resonator coupled to a graphene double quantum dot (DQD), which was etched almost isolated from the reservoir and reached the low tunnel rate region. The charge stability diagram of DQD was investigated via dispersive phase and magnitude shift of the resonator with a high quality factor. Its complex admittance and low tunnel rate to the reservoir was also determined from the reflected signal of the on-chip resonator. Our method may provide a non-invasive and sensitive way of charge state readout in isolated quantum dots.

• OSTI ID: 22310922
• Journal Information: Applied Physics Letters, Vol. 105, Issue 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0003-6951
• Country of Publication: United States
• Language: English

Related Subjects

75 CONDENSED MATTER PHYSICS
SUPERCONDUCTIVITY AND SUPERFLUIDITY
CHARGE STATES
GRAPHENE
QUALITY FACTOR
QUANTUM DOTS
RADIOWAVE RADIATION
READOUT SYSTEMS
REFLECTION
RESONATORS
SPECTRA
STABILITY
TUNNEL EFFECT