Mode imaging and loss evaluation of semiconductor waveguides

Journal Article · Thu May 15 00:00:00 EDT 2014 · Review of Scientific Instruments

DOI:https://doi.org/10.1063/1.4879335· OSTI ID:22309001

Mochizuki, Toshimitsu ^[1]; Kim, Changsu; Yoshita, Masahiro; Nakamura, Takahiro; Akiyama, Hidefumi ^[1]; Pfeiffer, Loren N.; West, Ken W. ^[2]

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1. Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba (Japan)
2. Department of Electrical Engineering, Princeton University, New Jersey 08544 (United States)

An imaging and loss evaluation method for semiconductor waveguides coupled with non-doped quantum wells is presented. Using the internal emission of the wells as a probe light source, the numbers and widths of the modes of waveguides with various ridge sizes were evaluated by CCD imaging, and the obtained values were consistent with effective index method calculation. Waveguide internal losses were obtained from analyses of the Fabry-Pérot fringes of waveguide emission spectra. We quantified the quality of 29 single-mode waveguide samples as an internal loss and variation of 10.2 ± 0.6  cm{sup −1}.

• OSTI ID: 22309001
• Journal Information: Review of Scientific Instruments, Vol. 85, Issue 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
• Country of Publication: United States
• Language: English

Related Subjects

46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY
71 CLASSICAL AND QUANTUM MECHANICS
GENERAL PHYSICS
CHARGE-COUPLED DEVICES
EMISSION
EMISSION SPECTRA
IMAGES
LIGHT SOURCES
PROBES
QUANTUM WELLS
SEMICONDUCTOR MATERIALS
WAVEGUIDES