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Title: Mode imaging and loss evaluation of semiconductor waveguides

An imaging and loss evaluation method for semiconductor waveguides coupled with non-doped quantum wells is presented. Using the internal emission of the wells as a probe light source, the numbers and widths of the modes of waveguides with various ridge sizes were evaluated by CCD imaging, and the obtained values were consistent with effective index method calculation. Waveguide internal losses were obtained from analyses of the Fabry-Pérot fringes of waveguide emission spectra. We quantified the quality of 29 single-mode waveguide samples as an internal loss and variation of 10.2 ± 0.6  cm{sup −1}.
Authors:
 [1] ;  [2] ; ; ; ;  [1] ; ;  [3]
  1. Institute for Solid State Physics, The University of Tokyo, Kashiwanoha 5-1-5, Kashiwa, Chiba (Japan)
  2. (Japan)
  3. Department of Electrical Engineering, Princeton University, New Jersey 08544 (United States)
Publication Date:
OSTI Identifier:
22309001
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; 71 CLASSICAL AND QUANTUM MECHANICS, GENERAL PHYSICS; CHARGE-COUPLED DEVICES; EMISSION; EMISSION SPECTRA; IMAGES; LIGHT SOURCES; PROBES; QUANTUM WELLS; SEMICONDUCTOR MATERIALS; WAVEGUIDES