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Title: A portable high-resolution soft x-ray and extreme ultraviolet spectrometer designed for the Shanghai EBIT and the Shanghai low energy EBITs

A portable high resolution soft x-ray and extreme ultraviolet (EUV) spectrometer has been developed for spectroscopic research at the Shanghai Electron Beam Ion Trap (EBIT) laboratory. A unique way of aligning the grazing incidence spectrometer using the zero order of the grating is introduced. This method is realized by extending the range of the movement of the CCD detector to cover the zero order. The alignment can be done in a few minutes, thus leading to a portable spectrometer. The high vacuum needed to be compatible with the EBITs is reached by mounting most of the translation and rotation stages outside the chamber. Only one high vacuum compatible linear guide is mounted inside the chamber. This is to ensure the convenient interchange of the gratings needed to enable wavelength coverage of the whole range of 10 to 500 Å. Spectra recorded with one of our low energy EBITs shows that a resolving power of above 800 can be achieved. In the slitless configuration used in this work, we found the resolving power to be limited by the width of the EBIT plasma. When mounted on the Shanghai EBIT which is a high energy EBIT and has a narrower EBIT plasmamore » width, the estimated resolving power will be around 1400 at 221.15 Å.« less
Authors:
; ; ; ; ; ; ;  [1] ;  [2] ;  [3]
  1. EBIT Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433 (China)
  2. (Ministry of Education), Fudan University, Shanghai 200433 (China)
  3. Lund Observatory, Lund University, Lund SE-22100 (Sweden)
Publication Date:
OSTI Identifier:
22308998
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHARGE-COUPLED DEVICES; ELECTRON BEAMS; EXTREME ULTRAVIOLET RADIATION; GRAZING INCIDENCE TOMOGRAPHY; IONS; PLASMA; PRESSURE RANGE MICRO PA; PRESSURE RANGE MILLI PA; RESOLUTION; SOFT X RADIATION; SPECTROMETERS; WAVELENGTHS