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Title: A novel von Hamos spectrometer for efficient X-ray emission spectroscopy in the laboratory

We present a novel, highly efficient von Hamos spectrometer for X-ray emission spectroscopy (XES) in the laboratory using highly annealed pyrolitic graphite crystals as the dispersive element. The spectrometer covers an energy range from 2.5 keV to 15 keV giving access to chemical speciation and information about the electronic configuration of 3d transition metals by means of the Kβ multiplet. XES spectra of Ti compounds are presented to demonstrate the speciation capabilities of the instrument. A spectral resolving power of E/ΔE = 2000 at 8 keV was achieved. Typical acquisition times range from 10 min for bulk material to hours for thin samples below 1 μm.
Authors:
; ; ; ; ;  [1]
  1. Institute for Optic and Atomic Physics, Technical University Berlin, Hardenbergstr. 36, 10623 Berlin (Germany)
Publication Date:
OSTI Identifier:
22308854
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 5; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CRYSTALS; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; GRAPHITE; KEV RANGE; PYROLYTIC CARBON; SPECTROMETERS; TITANIUM COMPOUNDS; TRANSITION ELEMENTS; X-RAY EMISSION ANALYSIS