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Title: Note: Fast imaging of DNA in atomic force microscopy enabled by a local raster scan algorithm

Approaches to high-speed atomic force microscopy typically involve some combination of novel mechanical design to increase the physical bandwidth and advanced controllers to take maximum advantage of the physical capabilities. For certain classes of samples, however, imaging time can be reduced on standard instruments by reducing the amount of measurement that is performed to image the sample. One such technique is the local raster scan algorithm, developed for imaging of string-like samples. Here we provide experimental results on the use of this technique to image DNA samples, demonstrating the efficacy of the scheme and illustrating the order-of-magnitude improvement in imaging time that it provides.
Authors:
 [1] ;  [2]
  1. Western Digital Technologies, Irvine, California 92612 (United States)
  2. Department of Mechanical Engineering and Division of Systems Engineering, Boston University, Boston, Massachusetts 02215 (United States)
Publication Date:
OSTI Identifier:
22308849
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; ALGORITHMS; ATOMIC FORCE MICROSCOPY; DESIGN; DNA; IMAGES