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Title: A new clocking method for a charge coupled device

We propose and demonstrate a new clocking method for a charge-coupled device (CCD). When a CCD is used for a photon counting detector of X-rays, its weak point is a limitation of its counting rate, because high counting rate makes non-negligible pile-up of photons. In astronomical usage, this pile-up is especially severe for an observation of a bright point-like object. One typical idea to reduce the pile-up is a parallel sum (P-sum) mode. This mode completely loses one-dimensional information. Our new clocking method, panning mode, provides complementary properties between the normal mode and the P-sum mode. We performed a simple simulation in order to investigate a pile-up probability and compared the simulated result and actual obtained event rates. Using this simulation and the experimental results, we compared the pile-up tolerance of various clocking modes including our new method and also compared their other characteristics.
Authors:
;  [1] ;  [2]
  1. Department of Physics, College of Science, Rikkyo University, 3-34-1, Nishi-Ikebukuro, Toshima–ku, Tokyo 171–8501 (Japan)
  2. Department of Information Science, Faculty of Liberal Arts, Tohoku Gakuin University, 2-1-1 Tenjinzawa, Izumi-ku, Sendai, Miyagi 981-3193 (Japan)
Publication Date:
OSTI Identifier:
22308832
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; CHARGE-COUPLED DEVICES; COMPARATIVE EVALUATIONS; COUNTING RATES; PHOTONS; PROBABILITY; PULSE PILEUP; TOLERANCE; X-RAY DETECTION