skip to main content

SciTech ConnectSciTech Connect

Title: A low energy ion source for electron capture spectroscopy

We report on the design of an ion source for the production of single and double charged Helium ions with kinetic energies in the range from 300 eV down to 5 eV. The construction is based on a commercial sputter ion gun equipped with a Wien-filter for mass/charge separation. Retardation of the ions from the ionizer potential (2 keV) takes place completely within the lens system of the sputter gun, without modification of original parts. For 15 eV He{sup +} ions, the design allows for beam currents up to 30 nA, limited by the space charge repulsion in the beam. For He{sup 2+} operation, we obtain a beam current of 320 pA at 30 eV, and 46 pA at 5 eV beam energy, respectively. In addition, operating parameters can be optimized for a significant contribution of metastable He*{sup +} (2s) ions.
Authors:
 [1] ;  [1] ;  [2]
  1. Max-Planck-Institut für Mikrostrukturphysik, Weinberg 2, 06120 Halle (Germany)
  2. (Germany)
Publication Date:
OSTI Identifier:
22308805
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 6; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BEAM CURRENTS; ELECTRON CAPTURE; EV RANGE; HELIUM 2; HELIUM IONS; ION SOURCES; KEV RANGE; KINETIC ENERGY; LENSES; SPACE CHARGE; SPECTROSCOPY; SPUTTERING