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Title: Near- and far-field measurements of phase-ramped frequency selective surfaces at infrared wavelengths

Near- and far-field measurements of phase-ramped loop and patch structures are presented and compared to simulations. The far-field deflection measurements show that the phase-ramped structures can deflect a beam away from specular reflection, consistent with simulations. Scattering scanning near-field optical microscopy of the elements comprising the phase ramped structures reveals part of the underlying near-field phase contribution that dictates the far-field deflection, which correlates with the far-field phase behavior that was expected. These measurements provide insight into the resonances, coupling, and spatial phase variation among phase-ramped frequency selective surface (FSS) elements, which are important for the performance of FSS reflectarrays.
Authors:
;  [1] ;  [2] ;  [3]
  1. Department of Physics and Optical Science, University of North Carolina at Charlotte, 9201 University City Blvd., Charlotte, North Carolina 28223 (United States)
  2. CREOL, The College of Optics and Photonics, University of Central Florida, 4304 Scorpius St., Orlando, Florida 32816 (United States)
  3. Department of Physics, Department of Chemistry, and JILA, University of Colorado, 390 UCB, Boulder, Colorado 80309 (United States)
Publication Date:
OSTI Identifier:
22308704
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 4; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; BEAMS; COUPLING; INFRARED RADIATION; OPTICAL MICROSCOPY; REFLECTION; SCATTERING; SIMULATION; SURFACES