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Title: In situ anodization of aluminum surfaces studied by x-ray reflectivity and electrochemical impedance spectroscopy

We present results from the anodization of an aluminum single crystal [Al(111)] and an aluminum alloy [Al 6060] studied by in situ x-ray reflectivity, in situ electrochemical impedance spectroscopy and ex situ scanning electron microscopy. For both samples, a linear increase of oxide film thickness with increasing anodization voltage was found. However, the slope is much higher in the single crystal case, and the break-up of the oxide film grown on the alloy occurs at a lower anodization potential than on the single crystal. The reasons for these observations are discussed as are the measured differences observed for x-ray reflectivity and electrochemical impedance spectroscopy.
Authors:
; ; ; ;  [1] ; ;  [2] ;  [3] ;  [4]
  1. Division of Synchrotron Radiation Research, Lund University, Box 118, 221 00 Lund (Sweden)
  2. KTH Royal Institute of Technology, School of Chemical Science and Engineering, Department of Chemistry, Division of Surface and Corrosion Science, Drottning Kristinas väg 51, 10044 Stockholm (Sweden)
  3. ESRF, B. P. 220, 38043 Grenoble (France)
  4. Sapa Technology, Kanalgatan 1, 612 31 Finspång (Sweden)
Publication Date:
OSTI Identifier:
22308702
Resource Type:
Journal Article
Resource Relation:
Journal Name: Journal of Applied Physics; Journal Volume: 116; Journal Issue: 3; Other Information: (c) 2014 Author(s); Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
75 CONDENSED MATTER PHYSICS, SUPERCONDUCTIVITY AND SUPERFLUIDITY; ALUMINIUM; ALUMINIUM ALLOYS; ANODIZATION; ELECTRIC POTENTIAL; ELECTROCHEMISTRY; FILMS; IMPEDANCE; MONOCRYSTALS; OXIDES; REFLECTIVITY; SCANNING ELECTRON MICROSCOPY; SPECTROSCOPY; SURFACES; THICKNESS; X RADIATION