Note: Dynamic strain field mapping with synchrotron X-ray digital image correlation
- CAS Key Laboratory of Mechanical Behavior and Design of Materials, Department of Modern Mechanics, University of Science and Technology of China, Hefei, Anhui 230027 (China)
- The Peac Institute of Multiscale Sciences, Chengdu, Sichuan 610207 (China)
- School of Aeronautics and Astronautics, Purdue University, West Lafayette, Indiana 47907 (United States)
- Advanced Photon Source, Argonne National Laboratory, Argonne, Illinois 60439 (United States)
We present a dynamic strain field mapping method based on synchrotron X-ray digital image correlation (XDIC). Synchrotron X-ray sources are advantageous for imaging with exceptional spatial and temporal resolutions, and X-ray speckles can be produced either from surface roughness or internal inhomogeneities. Combining speckled X-ray imaging with DIC allows one to map strain fields with high resolutions. Based on experiments on void growth in Al and deformation of a granular material during Kolsky bar/gas gun loading at the Advanced Photon Source beamline 32ID, we demonstrate the feasibility of dynamic XDIC. XDIC is particularly useful for dynamic, in-volume, measurements on opaque materials under high strain-rate, large, deformation.
- OSTI ID:
- 22308695
- Journal Information:
- Review of Scientific Instruments, Vol. 85, Issue 7; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA); ISSN 0034-6748
- Country of Publication:
- United States
- Language:
- English
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