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Title: An integrated data analysis tool for improving measurements on the MST RFP

Many plasma diagnostics contain complementary information. For example, the double-foil soft x-ray system (SXR) and the Thomson Scattering diagnostic (TS) on the Madison Symmetric Torus both measure electron temperature. The complementary information from these diagnostics can be combined using a systematic method based on integrated data analysis techniques, leading to more accurate and sensitive results. An integrated data analysis tool based on Bayesian probability theory was able to estimate electron temperatures that are consistent with both the SXR and TS diagnostics and more precise than either. A Markov Chain Monte Carlo analysis to increase the flexibility of the tool was implemented and benchmarked against a grid search method.
Authors:
; ; ; ;  [1] ;  [2] ;  [1] ;  [3]
  1. Physics Department, University of Wisconsin-Madison, Madison, Wisconsin 53706 (United States)
  2. Consorzio RFX, EURATOM-ENEA Association, Padova (Italy)
  3. (United States)
Publication Date:
OSTI Identifier:
22308628
Resource Type:
Journal Article
Resource Relation:
Journal Name: Review of Scientific Instruments; Journal Volume: 85; Journal Issue: 11; Other Information: (c) 2014 AIP Publishing LLC; Country of input: International Atomic Energy Agency (IAEA)
Country of Publication:
United States
Language:
English
Subject:
46 INSTRUMENTATION RELATED TO NUCLEAR SCIENCE AND TECHNOLOGY; BENCHMARKS; DATA ANALYSIS; ELECTRON TEMPERATURE; FOILS; MARKOV PROCESS; MONTE CARLO METHOD; PLASMA DIAGNOSTICS; PROBABILITY; REVERSED-FIELD PINCH DEVICES; SOFT X RADIATION; THOMSON SCATTERING